Hierarchical clustering driven test case selection in digital circuits

Engineering

• Case Selection 100%
• Digital Circuits 100%
• Hierarchical Clustering 100%
• Similarities 50%
• Minimal Set 50%
• Hamming Distance 50%
• Clustering Algorithm 50%
• Distance Value 50%
• Functional Specification 50%
• Test Group 50%

Computer Science

• Digital Circuit 100%
• Hierarchical Clustering 100%
• Time Development 50%
• Small Fraction 50%
• Proper Operation 50%
• Clustering Algorithm 50%
• Hamming Distance 50%
• Functional Specification 50%
• Quality Management 50%